Table 295. Testflash Block Memory Map - STMicroelectronics SPC572L series Reference Manual

Embedded Flash Memory (MP55)
Table 294. Flash Memory Partition 1 memory map(Continued)
Block Absolute addresses
—
—
29.2.1.3 TestFlash block memory map
The TestFlash block exists outside the normal address space and is programmed, erased
and read independently of the other blocks. The independent TestFlash block is also
included to support systems which require nonvolatile memory for security and to store
system initialization information.
A section of the TestFlash is reserved for storing the nonvolatile information related to
Redundancy, Configuration and Protection. The usage of reserved TestFlash block is
detailed in
Address Offset
0x0000
0x0008
0x000C
0x0010
0x0020
0x0030
0x0040
0x0060
0x0080
0x00A0
0x00B4
0x00B5
0x00B6
0x00B7
0x0100
0x0104
0x0200
0x1000
0x0000
596/2058
—
—
Table 295.

Table 295. TestFlash block memory map

UTEST (Base Address 0x0040_0000 to 0x0040_1FFF)
OTP area for Device Serial Number
Test Mode Disable Seal
Test Mode Disable Block Select 0
Factory Erase Diary Location
Test Mode Disable Block Select 1
Customer Single Bit Correction area
Customer Double Bit Detection area
Flash Firmware — Minor identifier (f)
Flash Firmware — Major identifier (F)
Flash parameters identifiers (P)
Flash Firmware and parameters — unused
Test Mode Disable Override Passcode0
Customer OTP data
BAF (Base Address 0x0040_4000 to 0x0040_5FFF)
User OTP – BAF Area
DocID027809 Rev 4
Size Address Space
— —
— —
Description
Reserved
Reserved
Reserved
Reserved
Reserved
LOCK
A256KLOCK[7] A256KSEL[7]
A256KLOCK[8] A256KSEL[8]
Size
8 byte
4 byte
4 byte
16 byte
16 byte
16 byte
32 byte
32 byte
32 byte
96 byte
1 byte
1 byte
1 byte
1 byte
4 byte
252 byte
3584 byte
4096 byte
8 KB
RM0400
SEL
Access
R/P
R/P
R/P
R/P
R/P
R/P
R
R
R/P
R/P
R
R
R
R
R/P
R/P
R/P
R/P
R/P