Selecting Flash Memory Blocks For Test Mode Disable Seal - STMicroelectronics SPC572L series Reference Manual

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Flash Memory Programming and Configuration
1.
Select individual flash blocks to be protected by programming the appropriate values
into the Test Mode Disable Block Select Group A and Test Mode Disable Block Select
Group B areas shown in the UTEST flash memory map.
2.
Program a valid passcode into the Test Mode Override Passcode area shown in the
UTEST flash memory map.
3.
Program the value 0x2D3C_4B5A into the Test Mode Disable Seal location specified in
the UTEST flash memory map.
After the next reset is asserted, Test Mode is permanently passcode protected.
Note:
Blocks selected for test mode disable can be selected in either or both Test Mode Disable
Block Select Groups (A and B) because those fields are logically ORed to determine the
blocks to be protected.
The lifecycle state must be programmed to 'Production at OEM' or later for the disable seal
to be in effect.
31.7.3

Selecting flash memory blocks for test mode disable seal

Selecting flash memory blocks for test mode disable seal protection involves writing to non-
register flash locations. In the case of the test mode disable seal function, there are two
areas of UTEST flash memory that have identical mapping to flash memory blocks. When
the test mode disable seal takes effect, the mapped bits are logically ORed to determine the
blocks to be protected.
The mapping of bits to blocks for this function is identical to the mapping used for other
functions. See the table in the device configuration chapter for the map.
Note:
Selecting a block for test mode disable requires a '0' in the mapped bit—not a '1' as with
other functions.
31.8
Security configuration planning
31.8.1
Creating password groups
Most basic security features in the SPC572Lx microcontroller are password-based.
Therefore, one of the early tasks that must be performed is the creation of four 256-bit
passwords. They are programmed by the customer into the locations identified in the
UTEST memory map
The UTEST memory map fields to be written are:
PASS Password Group 0
PASS Password Group 1
PASS Password Group 2
PASS Password Group 3
Passwords must not be one of the following, which are considered insecure and therefore
invalid:
0x0000_0000
0xFFFF_FFFF
0x5555_5555
672/2058
(Table
11) in
Chapter 5: Memory
DocID027809 Rev 4
map.
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