STMicroelectronics SPC572L series Reference Manual page 115

RM0400
Start address End address
0x00400010 0x0040001F
0x00400020 0x0040002F
0x00400030 0x0040003F
0x00400040 0x0040005F
0x00400060 0x0040007F
0x00400080 0x0040009F
0x004000A0 0x004000BF
0x004000C0 0x004000FF
0x00400100 0x00400103
0x00400104 0x0040011F
Table 11. UTEST flash memory map(Continued)
Allocated
size
[bytes]
Test Mode Disable Block
16
Select Group A
16 Factory Erase diary Location
Test Mode Disable Block
16
Select Group B
Customer Single Bit
32
Correction Area
Customer Double Bit
32
Detection Area
Customer EDC after ECC
32
Area
32 Unique Identifier (UID)
—
Test Mode Override
4
Passcode
— Reserved
DocID027809 Rev 4
Description
Programmed by the customer to
select which blocks can NOT be
tested in Failure Analysis
Programmed by the customer
before one-time factory erase is
allowed
Secondary location that can be
programmed by the customer to
select which blocks can NOT be
tested in Failure Analysis
Programmed by factory to include
ECC/EDC errors to allow testing of
ECC/EDC hardware
Programmed during factory test.
The UID includes information on
Wafer lot, X/Y-position on the wafer,
manufacturing data, test results,
flash firmware ID and parameters,
company ID:
66 = STMicroelectronics
Reserved
Protected from read operations
by
flash BIU from Production at
OEM
Life Cycle.
Programmed by customer.
Becomes
unreadable (hidden) as soon as
customer programs lifecycle
stage to
'Production at OEM' or later
Memory map
Comments
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