Fine Matching - Omron F250-UME Software Manual

Fine Matching

2-18 Fine Matching
The registered image for an acceptable product and the input image are over-
laid (matched) and the differences are detected quickly and accurately. This
enables small defects in the pattern and writing on the measurement object to
be detected with a high level of accuracy.
Example: Label Defect Inspection
Acceptable product
image (registered)
Defects are shown in NG color. Judgment is made based
on area of difference from acceptable product image.
Slight defect
Refer to
Inspection image
Matched
NG
0.Scn 0 RUN
Printing error
Edge defect
Section 2-18
Pattern defect
for details.
2-18-(1)