Omron F250-UME Software Manual page 259

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Detecting Binary Defects
2-12-3-2
Gravity and Axis
SeeAlso
1
(As required)
2
Change
Set mea-
binary level
surement
for each
conditions.
region.
STEP 1: Changing Binary Level for Each Region
CHECK
The Detailed Conditions Settings Screen will be displayed.
Detailed conditions
2.
Set the number of pixels to skip.
3.
Select End.
The setting will be registered and the screen in (1.) will return.
Density images taken by the Camera are converted into binary images made
up of black and white pixels and then measured. The size (area), position
(center of gravity), and axis angle of the white-pixel area is calculated.
Refer to page 2-12-(6).
(As required)
3
Draw mea-
surement
region.
Use this function to change the binary level settings for each region.
Set the level for converting 256-gradation images into binary images. Mea-
surements are performed for the white pixels. Therefore, make the settings so
that the measurement object is white.
If Binary defect/Binary (Common) are changed after the binary levels are
changed for each region, the settings for each region are disabled and the set-
ting levels under Binary defect/Binary (Common) are enabled.
1.
Select Binary defect.
0.Scn 0=SET=
ENT:Set SFT+ESC:Edit
Skipping X : [ 1]
Skipping Y : [ 1]
End
4
(As required)
5
Re-register
reference
value.
0.Camera image
1.Binary defect
2.
Section 2-12
6
(As required)
Set
Change
judgement
pixel
conditions.
skipping.
2-12-(16)

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