Omron F250-UME Software Manual page 267

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Detecting Binary Defects
SeeAlso
1
2
(As required)
Change
Set mea-
binary level
surement
for each
condi-
region.
tions.
STEP 1: Changing Binary Level for Each Region
CHECK
location of the measurement object can be determined using the edge detec-
tion points so the measurement region can be adapted to suit if the size or
position of the measurement object changes.
Once the edges have been located, the image is converted to binary and the
area and center of gravity of the measurement region is measured.
Refer to page 2-12-(7).
3
(As required)
Set mea-
surement
region.
Perform this operation to change the binary level for each region.
Set the level for converting 256-gradation images into binary images. Mea-
surements are performed for the white pixels. Therefore, make the settings so
that the measurement object is white.
If Binary defect/Binary (Common) are changed after the binary levels are
changed for each region, the settings for each region are disabled and the set-
ting levels under Binary defect/Binary (Common) are enabled.
1.
Select Binary defect.
0.Scn 0=SET=
0.Camera image
1.Binary defect
2.
ENT:Set SFT+ESC:Edit
The setting selections will be displayed.
1.Binary defect
2.
Select Select region.
4
(As required)
Register
reference
value.
Measurement image
Binary(Common)
Select region
Coordinate mode
Section 2-12
5
6
(As required)
Set
Change
judgement
pixel
conditions.
skipping.
2-12-(24)

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