Omron F250-UME Software Manual page 303

Density Defects
Measurement region
Defect (Deviation)
The upper, lower, left, and right edges of the measurement object are found.
The region inside the edges that are found will be the measurement region.
Left edge
With the edges detected, the Controller can determine where the measure-
ment object is. Even if the size and position of the measurement object
changes, the Controller can move the measurement region appropriately.
Use a Defect (Deviation) measurement to quickly measure multiple regions.
Defect (Deviation) measurement can measure other regions on the same unit
in parallel, making the total processing time shorter when multiple regions are
registered to the same unit and measured.
Example: Inspecting for Chips, Burrs, or Defects on Caps
Chips and burrs on caps are measured using a Defect (Circumference)
inspection and defects are measured using Defect (Deviation)/Circle Proximity.
Upper edge
Measurement region
Right edge
Lower edge
Measurement region
Region 0
Chips and burrs inspected using a
Defect (Circumference) inspection.
Region 1
Internal cap defects inspected
using Defect (Deviation)/Circle
Proximity.
Section 2-14
2-14-(5)