Omron F250-UME Software Manual page 336

EC Defect
2-15-1 Selecting Measurement Images
CHECK
2-15-(3)
This section describes how to select the image stored at either Image 0 or
Image 1 as the image for measurement.
The edges are extracted for the image number selected here and this image is
then stored at the other image number. Set Change Filtering as the next pro-
cessing item to use this image for measurement for units after the unit for
which EC defect inspection was set. Then store the image stored in the image
buffer to Image 0 or Image 1.
When Image 0 Is Selected as Measurement Image
Image
0
Edge extracting
Edge-extracted image
Image
stored to Image 1.
1
1. Select EC defect.
ENT:Set SFT+ESC:Edit
The initial screen for EC defect inspection will be displayed.
2. Select Measurement Image.
The selections will be displayed.
Measurement image
3. Select which image will be used for measurement, the image stored at Im-
age 0 or the image stored at Image 1.
0.Scn 0=SET=
0.Camera image
1.ECM search
2.Change filtering
3.Binary defect
4.
Reads image again from image buffer.
0.Scn 0=SET=
0.Camera image
1.EC defect
2.
Measurement image
Extract edges
Removal regions
Removal image
Inspected regions
Coordinate mode
Image0
Image1
Section 2-15
Image 1 to be used for
measurement