Introduction - STMicroelectronics SPC572L series Reference Manual

IEEE 1149.7 Compact JTAG Test Access Port Controller (CJTAG)
Abbreviation
TAP.1
TAP.7
TCA
TCK
TCKC
TDIC
TDO
TDOC
TMS
TMSC
60.3

Introduction

The CJTAG module implements parts of the IEEE 1149.7 standard for test and debug
capabilities. IEEE 1149.7 defines enhanced test and debug capabilities which are
backwards compatible with IEEE P1149.1. This standard is also known as "Compact JTAG"
or "CJTAG".
The module implements the following parts of the IEEE 1149.7 standard:
•
IEEE 1149.1 compliant behavior while allowing multiple on-chip TAP controllers
•
Ability to assert test reset
•
Improved system scan performance with one-bit IR and DR chip bypass paths
•
Physical connection of a Debug and Test System (external tool) to a running system
without corrupting its operation
•
Operation with both 4-pin and 2-pin scan topologies
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Table 971. Abbreviations(Continued)
TAP Test Access Port
An IEEE 1149.1 Test Access Port
An IEEE 1149.7 Test Access Port
Tap Controller Address
Test Clock
Test Clock Compact
TDI Test Data Input
Test Data Input Compact
Test Data Output
Test Data Output Compact
Test Mode Select
Test Mode Select Compact
TS Target System
ZBS Zero Bit Scan
Expansion
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