STMicroelectronics SPC572L series Reference Manual page 2030

Revision history
Date
03-Apr-2013
2030/2058
Table 1150. Revision history(Continued)
Rev
Chapter 8: Reset and Boot
Removed all instances of "[FUNC]" and "[DEST]"
Section 8.3.2, Power-up phase: power
sections:
– PHASE1[FUNC] Phase: temporization and monitoring setup
– PHASE2[FUNC] Phase: flash initial configuration
– PHASE3[FUNC] Phase: device configuration monitoring
Section 8.3.3, PHASE0 Phase: analog supply initial
correction—flash memory is not initialized during PHASE0
Section 7.4.3.2, Reset Generation Module has entered idle state (state 1
and 2): removed "LBIST and MBIST have completed their test cycles"
Table 65 (Module status during reset phases): removed "P1[DEST]-
P3[DEST]" colums
Section 7.4.4.7, Core continues BAF code execution (state 23): changed
"IOP" to "Core" in title
Section 8.4.6.9, IOP begins BAF code execution (state
to "Core" in title
Chapter 9: Device Configuration Format (DCF) Records
Removed references to STCU2, tamper detection, LBIST and MBIST
Table 112: DCF client
– Added OTP section with 4 corresponding OTP_ENx registers
– Set UTEST Miscellaneous reset value to 0x00000941
Figure 45 (UTEST Miscellaneous DCF Client)
2
Miscellaneous DCF Client field
(cont'd)
3p3V_5V)
Updated Figure 33 (PMC_REE bits DCF Client):
Updated Table 74 (PMC_REE bits DCF client field descriptions)
Chapter 10: Power management
Major content revision to reflect new voltage detector setup
Figure 49 (Device high voltage power-ground
Section 10.2.1, Low power support and STOP mode
updated content describing how peripheral modules can be
enabled/disabled in STOP mode; modified quantities referring to CAN
modules.
Table 71 (SYSTEM modes): deleted "STANDBY wakeup" from DRUN
mode Entry column
Table 72 (USER modes): deleted "STANDBY through S/W" from RUNx
mode Exit column
Table 117: Device power management controller external
"VDD_LV_BD"
Table 74 (POR and voltage monitors description): added definitions of REE
and IE to footnote
Table 75 (Voltage monitors configurability): replaced "IEE" with "IE" in
header row; added footnotes to define REE, RES, and IE
Table 122: Functional terminal state during power-up and
TMS POWERUP pad state from "high impedance" to "weak pull-up";
changed TDI POWERUP pad state from "high impedance" to "weak pull-
up"; changed TDO RESET pad state from to "weak pull-up" to "high
impedance".
DocID027809 Rev 4
Changes
stabilization: removed following
list:
descriptions: set bit 18 to "reserved" (was
network): major update
RM0400
configuration:
22): changed "IOP"
and Table 114: UTEST
implementation:
signals: removed
reset: changed