Table 994. Mscan Scan Format Use Case Summary - STMicroelectronics SPC572L series Reference Manual

IEEE 1149.7 Compact JTAG Test Access Port Controller (CJTAG)
Scan format
STL Stalls
Test
Non-compliant behavior STL IP
MScan
Multi-chip debug communication
Controller ID Allocation
Non-shift TAP controller states
MScan nTDI TMS
60.7.8.3.3 OScan Scan Formats
The OScan scan formats provide optimization choices where no knowledge of the data
content of the scan exchange is needed. The Scan Packet content of these scan formats is
modulated by a combination of the scan format and the TAPC state for some OScan scan
formats. For instance, TDI data and TDO data is not exchanged for non-shift TAPC states
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Table 994. MScan scan format use case summary

Supporting
Table 995. MScan Scan Packet content
PC0 RDY PC1
Figure 1043. MScan Transaction
TCKC
SYS_TCKC
Virtual TAP
Exit2-IR Update-IR
Controller
State
SP
TMSC
A 1 1 1 1 A A 1 1 1 1
Real TAP
Controller
Exit2-IR Update-IR
State
Legend:SP == Scan Packet A == Any value
DocID027809 Rev 4
Performance
Least
TDO nTDI
Stall
Select-DR Capture-DR
SP SP SP
A A 0 1 1 1 A A 0 1 0
Select-DR Capture-DR
Flexibility
Best External tool or TS
Shift TAP controller states
TMS PC0 RDY
One-bit Scan
Shift-DR Exit1-DR
SP SP
1 1 1 A A 1 1 1 1 A A 1 1 1 1 A A 1
Shift-DR Exit1-DR
RM0400
TCKC source
PC1 TDO