References - STMicroelectronics SPC572L series Reference Manual

RM0400
60 IEEE 1149.7 Compact JTAG Test Access Port
Controller (CJTAG)
60.1

References

•
IEEE Std 1149.1-2001 (R2008), Standard Test Access Port and Boundary-Scan
Architecture
•
IEEE Std 1149.7, Standard for Reduced-Pin and Enhanced-Functionality Test Access
Port and Boundary-Scan Architecture
60.2 Abbreviations
Abbreviation
APU
APFC
CGM
CGMC
CJTAG
CLTAPC
CPA
DCU
EOT
EPU
Jscan
Mscan
nTRST
Oscan
PSS
RSU
Sscan
SSD
SSM
IEEE 1149.7 Compact JTAG Test Access Port Controller (CJTAG)
Advanced Protocol Unit
Auxiliary Pin Function Control
Conditional Group Member
Conditional Group Membership Count
CID Controller ID
Compact JTAG
Chip-Level TAPC
CP Check Packet
Check Process Active
Data Channel Unit
End of Transfer
Extended Protocol Unit
JTAG Scan
Maximum-flexibility Scan
Active low Test Reset
Optimized Scan
Pause Selection State
Reset and Selection Unit
SP Scan Packet
SPA Scan Packet Active
Segmented Scan
Scan Selection Directive
Scan State Machine
STL System Test Logic
Table 971. Abbreviations
Expansion
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