A/D Test Register (Adtes) - Renesas RL78/G1P Hardware User Manual

16-bit single-chip microcontroller
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RL78/G1P

9.3.10 A/D test register (ADTES)

This register is used to select the + side reference voltage or  side reference voltage of the A/D converter, or the
analog input channel (ANIxx), the temperature sensor output voltage, or the internal reference voltage (1.45 V) as the A/D
conversion target for the A/D test function.
The ADTES register can be set by an 8-bit memory manipulation instruction.
Reset signal generation clears this register to 00H.
Address: F0013H After reset: 00H R/W
Symbol
7
ADTES
0
ADTES1
0
1
1
Other than above
Note The temperature sensor output voltage and internal reference voltage (1.45 V) can be selected only in
the HS (high-speed main) mode.
For detail, refer to Figure 22-3 Format of User Option Byte (000C2H).
Caution For the A/D test function, see 20.10 A/D test function.
R01UH0895EJ0100 Rev.1.00
Nov 29, 2019
Figure 9-14. Format of A/D Test Register (ADTES)
6
5
0
0
ADTES0
0
ANIxx/temperature sensor output voltage
(This is specified using the analog input channel specification register (ADS).)
0
The - side reference voltage (selected by the ADREFM bit of the ADM2 register)
1
The + side reference voltage (selected by the ADREFP1 or ADREFP0 bit of the ADM2
register)
Setting prohibited
4
3
0
0
A/D conversion target
/internal reference voltage output (1.45 V)
Note
CHAPTER 9 A/D CONVERTER
2
1
0
ADTES1
ADTES0
0
Note
266

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