Agilent Technologies 35670A Manual page 502

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As the frequency span decreases, the corresponding time record length increases. Overlap processing
becomes possible when the instrument takes more time to collect time records than it does to process
them. This allows you to make a faster measurement especially with narrow frequency spans. Overlap
processing also reduces statistical variance caused by windowing.
You can specify overlap either as a percentage or as a fraction of the time record length. SWE:OVER
0.22 is the same as SWE:OVER 22 PCT. The value you send is rounded to the nearest allowable
percentage (an integer between 0 an 99).
The query returns a value that indicates the amount of overlap currently specified. The value is returned
as a percent.
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