Agilent Technologies 35670A Manual page 283

DISPlay[:WINDow[1|2|3|4]]:TRACe:X:MATCh[1|2|3|4]
Modifies the X-axis scaling of a trace to match the X-axis scaling of the reference trace.
Command Syntax:
Example Statements:
Attribute Summary:
Description:
This command modifies the scaling of the X-axis of the trace selected with the [:WINDow[1|2|3|4]] trace
specifier to match the X-axis scaling of the reference trace. The MATCH[1|2|3|4] trace specifier selects
the reference trace. Omit the specifier or use 1 for trace A, 2 for trace B, 3 for trace C, and 4 for trace D.
The analyzer uses the current start and stop X-axis values of the reference trace for the trace selected with
the WINDow trace specifier. In addition, the analyzer modifies the spacing of the X-axis (specified with
the DISP:TRAC:X:SPAC command) to that of the reference trace.
If the trace formats are not compatible, the X-axis is not modified.
DISPlay[:WINDow[1|2|3|4]]:TRACe:X:MATCh[1|2|3|4]
OUTPUT 711;"DISPLAY:WIND4:TRAC:X:MATCH3"
OUTPUT 711;"disp:wind2:trac:x:matc1"
Option: not applicable
Synchronization Required:
Preset State: not applicable
SCPI Compliance:
no
instrument-specific
DISPlay
command
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