R&S ZNB Series User Manual page 252

Vector network analyzers
Table of Contents

Advertisement

®
R&S
ZNB/ZNBT
The minimum required is at least two points for every 90 degree phase angle
change in insertion loss (or 8 points per wavelength).
2. The "2x Thru's" return loss must be smaller than its insertion loss.
3. The "2x Thru's" insertion loss must be relatively linear, with a few wavelengths at
the highest frequency.
4. Use a 4-port "2x Thru" if strong far-end crosstalk (FEXT) is present.
5. Use a complete DUT w. fixture file for extraction.
Source: "In Situ De-Embedding (ISD) User's Guide" – November 11, 2018
4.7.10 Smart fixture de-embedding
Option R&S ZNB-K230/R&S ZNBT-K230
This option offers a pre-installed or service-retrofitted version of PacketMicro's Smart
Fixture De-embedding (SFD) for fixture de-embedding.
The tool is integrated into the de-embedding functionality of the analyzer firmware.
For general information about fixture de-embedding, see
modeling and
For detailed information about the SFD tool, see the product pages at
www.packetmicro.com/Products/sfd-tool.html.
4.7.11 Delta-L 4.0 PCB characterization
Option R&S ZNB-K231/R&S ZNBT-K231
Delta-L is a de-embedding methodology developed by Intel Corporation and is used for
de-embedding strip lines that include vias. Delta-L calculates the loss of PCB intercon-
nects and can be performed on single-ended or balanced interconnects.
The objective of Delta-L is to determine an insertion loss measurement defined on two
or more coupon lines of differing lengths. This ratio of insertion loss in dB/inch can be
applied to any trace length with similar vias.
For background information, see
https://www.intel.com/content/dam/www/public/us/en/documents/guides/delta-l-
plus-methodology-for-electrical-characterization-guide.pdf
https://ieeexplore.ieee.org/document/7048423
User Manual 1173.9163.02 ─ 62
deembedding",
on page 217.
Concepts and features
Optional extensions and accessories
Chapter 4.6.2.9, "Fixture
https://
252

Advertisement

Table of Contents
loading

Table of Contents