R&S ZNB Series User Manual page 230

®
R&S ZNB/ZNBT
where r = S
Measurement Procedure for ANSI C63.25
See the Rohde & Schwarz Application Card "Fast validation of EMC Test Sites above 1
GHz with Time-domain S
TD S
R&S ZNBT with maximum frequency 20 GHz or higher.
4.7.2.7 Extended time domain analysis
Option R&S ZNB-K20 / R&S ZNBT-K20
Option K20 extends the basic Time Domain representation capabilities of option K2 by
signal integrity testing functionality in the time domain.
Simulated Eye Diagram
With the impulse response calculated from the measured S parameters using the
inverse Fourier transform, it is possible to predict the system response to arbitrary time
domain signals by calculating the convolution of the input signal with the impulse
response.
With option R&S ZNB/ZNBT-K20, the R&S ZNB/ZNBT firmware implements a "virtual"
signal generator that is able to generate multilevel PAM signals (NRZ, PAM-4, PAM-8,
PAM-16), including a simulated low pass behavior. The simulated eye diagram using
the DUT's measured S parameters gives an extensive overview regarding the signal
integrity of the system.
Further building blocks for pre-emphasis, jitter, noise and equalization allow you to syn-
thesize effects of transmitter and receiver parts in the transmission system.
User Manual 1173.9163.02 ─ 62
/ S
21,reflected 21,direct
VSWR
measurements in accordance with ANSI C63.25 require a R&S ZNB or
VSWR
Optional extensions and accessories
.
", published on the Rohde & Schwarz internet site.
Concepts and features
230