Avaya S8700 Maintenance Manual page 1398

Maintenance-Object Repair Procedures
System Technician-Demanded Tests:
Descriptions And Error Codes
Always investigate tests in the order presented in the table below. By clearing
error codes associated with the Failure Audit for example, you may also clear
errors generated from other tests in the testing sequence. The Failure Audit test
is executed via the test board command.
Order of Investigation
Failure Audit (#949)
DS1 Interface Options Audit (#798)
Far-End Internal Loopback test
(#797)
Near-End External Loopback test
(#799)
1. D = Destructive; ND = Nondestructive
Far-End Internal Loop-Back Test (#797)
This test is destructive.
This test starts at the DS1 CONV circuit pack whose equipment location was
entered and traverses over the specified facility and loops at the internal facility
interface on the other DS1 CONV circuit pack in the DS1 CONV complex. See
diagram below.
Every part of this test is executed under firmware control and the result is sent
back to the maintenance software. The test is executed by sending digital data
through every DS1 channel on this facility. For TN574 DS1 Converter facilities,
test patterns are sent through every DS1 channel. For TN1654 DS1 Converter
facilities, test patterns are sent through one DS1 channel.
If there is only one DS1 facility available, the system will not allow that last facility
to be busied out. In that case, the DS1 CONV circuit pack must be busied out
before executing this test.
For a standard-, duplex-, or high-reliability system (no PNC duplication), if there is
only one DS1 facility available, then this test can only be executed at the endpoint
that is closer to the media server relative to the neighbor DS1 CONV circuit pack
because of its impacts on the system control links. For TN574 DS1 CONV
boards, the completion of the test will be delayed in this configuration to wait for
the recovery of the system control links. For a critical-reliability system (PNC
duplication) or for a system with multiple DS1 facilities, the test can be executed at
any DS1 CONV circuit pack.
8-676 Issue 1 May 2002
Short Test Long Test
Sequence Sequence
X X
X
External Reset
Loopback Sequence
X
555-233-143
1
D/ND
ND
ND
D
D