Avaya S8700 Maintenance Manual page 1460

Maintenance-Object Repair Procedures
Table 8-287. System Technician-Demanded Tests: EMG-XFER (Multicarrier Cabinets)
Order of Investigation
Battery & Battery Charger Query test (#5) (a)
AC Power Query test (#78) (b)
OLS Query test (Carrier E) (#127) (c)
OLS Query test (Carrier D) (#127) (c)
OLS Query test (Carrier A) (#127) (c)
OLS Query test (Carrier B) (#127) (c)
OLS Query test (Carrier C) (#127) (c)
Emergency Transfer Query test (#124)
Cabinet Sensors Query test (#122) (d)
External Alarm Lead Query test (#120) (e)
Analog Ring Generator Initialization test
Analog Ring Generator Initialization test (#117) (f)
Analog Ring Generator Query test (#118) (f)
1. D = Destructive, ND = nondestructive
Notes:
a. See ''POWER''
b. See ''AC-POWER''
c. See ''CARR-POW (Carrier Power Supply)''
d. See ''CABINET (Cabinet Sensors)''
e. See ''EXT-DEV ADMIN? Y (External Device Alarm)''
description of this test.
f. See ''RING-GEN''
up in the test sequence only if there is a TN768 or TN780 Tone-Clock
circuit pack in the EPN being tested.
8-738 Issue 1 May 2002
for a description of this test.
for a description of this test.
for a description of this test.
section for a description of this test. These tests show
Short Test Long Test
Sequence Sequence
X X
X X
X X
X X
X X
X X
X X
X X
X X
X X
X X
X X
for a description of this test.
section for a
555-233-143
1
D/ND
ND
ND
ND
ND
ND
ND
ND
ND
ND
ND
ND
ND