Section 22 Boundary Scan (Jtag); Features - Renesas H8S Series Hardware Manual

16-bit single-chip microcomputer

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Section 22 Boundary Scan (JTAG)

The JTAG (Joint Test Action Group) is standardized as an international standard, IEEE Standard

1149.1, and is open to the public as IEEE Standard Test Access Port and Boundary-Scan

Architecture. Although the name of the function is boundary scan and the name of the group who

worked on standardization is the JTAG, the JTAG is commonly used as the name of a boundary

scan architecture and a serial interface to access the devices having the architecture.

This LSI has a boundary scan function (JTAG). Using this function along with other LSIs

facilitates testing a printed-circuit board.

• Five test pins (ETCK, ETDI, ETDO, ETMS, and ETRST)

• TAP controller

• Six instructions

SAMPLE/PRELOAD mode

(These instructions are test modes corresponding to IEEE 1149.1.)

HUDS000A_000020020300

Section 22 Boundary Scan (JTAG)

Rev. 3.00 Jul. 14, 2005 Page 827 of 986

REJ09B0098-0300

H8s/2100 series H8s/2114r R4f2114r