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ADC
The ADC is a 12-bit, 200 ksamples/s ADC with eight inputs and a built-in voltage reference. The
ADC can be triggered by many different sources including timers, I/O pins, software, the analog
comparator, and the RTC.
An ADC is a peripheral that converts a continuous analog voltage to a discrete digital number. The
ADC module features 12-bit conversion resolution and supports eight input channels plus an
internal division of the battery voltage and a temperature sensor.
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Low-power SPI-I
The sensor controller also includes a low-power SPI-I
banging from the sensor controller engine. This can be used to periodically check digital sensors
and wake up the CC26xx and CC13xx devices when certain criteria are met.
The analog modules can be connected to up to eight different I/Os.
1.3.11 Random Number Generator
The random number generator generates true random numbers for backoff calculations or security keys.
1.3.12 cJTAG and JTAG
The Joint Test Action Group (JTAG) port is an IEEE standard that defines a test access port (TAP) and
boundary scan architecture for digital integrated circuits. The JTAG port also provides a standardized
serial interface for controlling the associated test logic. The TAP, Instruction Register (IR), and Data
Registers (DR) can be used to test the interconnections of assembled printed–circuit–boards (PCBs) and
obtain manufacturing information on the components. The JTAG port also provides a means of accessing
and controlling design-for-test features such as I/O pin observation and control, scan testing, and
debugging. The compact JTAG (cJTAG) interface has the following features:
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IEEE 1149.1-1990-compatible TAP controller
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IEEE 1149.7 cJTAG interface
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ICEPick JTAG router
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Four-bit IR chain for storing JTAG instructions
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IEEE standard instructions: BYPASS, IDCODE, SAMPLE and PRELOAD, EXTEST and INTEST
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ARM additional instructions: APACC, DPACC, and ABORT
SWCU117C – February 2015 – Revised September 2015
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Architectural Overview
Functional Overview
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