Trip-Zone Enable Interrupt Register (Tzeint); Trip-Zone Enable Interrupt Register (Tzeint) Field Descriptions - Texas Instruments Concerto F28M35 Series Technical Reference Manual

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Table 7-61. Trip-Zone Control Register Field Descriptions (continued)

LEGEND: R/W = Read/Write; R = Read only; -n = value after reset

Table 7-62. Trip-Zone Enable Interrupt Register (TZEINT) Field Descriptions

C28 Enhanced Pulse Width Modulator (ePWM) Module

Digital Compare Output A Event 1 Action On EPWMxA:

High-impedance (EPWMxA = High-impedance state)

Force EPWMxA to a high state.

Force EPWMxA to a low state.

Do Nothing, trip action is disabled

When a trip event occurs the following action is taken on output EPWMxB. Which trip-zone pins can

cause an event is defined in the TZSEL register.

High-impedance (EPWMxB = High-impedance state)

Force EPWMxB to a high state

Force EPWMxB to a low state

Do nothing, no action is taken on EPWMxB.

When a trip event occurs the following action is taken on output EPWMxA. Which trip-zone pins can

cause an event is defined in the TZSEL register.

High-impedance (EPWMxA = High-impedance state)

Force EPWMxA to a high state

Force EPWMxA to a low state

Do nothing, no action is taken on EPWMxA.

Figure 7-112. Trip-Zone Enable Interrupt Register (TZEINT)

Digital Comparator Output B Event 2 Interrupt Enable

Digital Comparator Output B Event 1 Interrupt Enable

Digital Comparator Output A Event 2 Interrupt Enable

Digital Comparator Output A Event 1 Interrupt Enable

Trip-zone One-Shot Interrupt Enable

Disable one-shot interrupt generation

Enable Interrupt generation; a one-shot trip event will cause a EPWMx_TZINT PIE interrupt.

Trip-zone Cycle-by-Cycle Interrupt Enable

Disable cycle-by-cycle interrupt generation.

Enable interrupt generation; a cycle-by-cycle trip event will cause an EPWMx_TZINT PIE interrupt.

SPRUH22I – April 2012 – Revised November 2019

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