Trip-Zone Submodule - Texas Instruments Concerto F28M35 Series Technical Reference Manual

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7.2.7 Trip-Zone (TZ) Submodule

shows how the trip-zone (TZ) submodule fits within the ePWM module.

Digital Compare

Each ePWM module is connected to six TZn signals (TZ1 to TZ6). TZ1 to TZ3 are sourced from the GPIO

mux. TZ4 is sourced from an inverted EQEPxERR signal on those devices with an EQEP module. TZ5 is

connected to the system clock fail logic, and TZ6 is sourced from the EMUSTOP output from the CPU.

These signals indicate external fault or trip conditions, and the ePWM outputs can be programmed to

respond accordingly when faults occur.

Purpose of the Trip-Zone Submodule

The key functions of the Trip-Zone submodule are:

Trip inputs TZ1 to TZ6 can be flexibly mapped to any ePWM module.

Upon a fault condition, outputs EPWMxA and EPWMxB can be forced to one of the following:

– High-impedance

– No action taken

Support for one-shot trip (OSHT) for major short circuits or over-current conditions.

Support for cycle-by-cycle tripping (CBC) for current limiting operation.

Support for digital compare tripping (DC) based on state of on-chip analog comparator module outputs

and/or TZ1 to TZ3 signals.

Each trip-zone input and digital compare (DC) submodule DCAEVT1/2 or DCBEVT1/2 force event can

be allocated to either one-shot or cycle-by-cycle operation.

Interrupt generation is possible on any trip-zone input.

Software-forced tripping is also supported.

The trip-zone submodule can be fully bypassed if it is not required.

SPRUH22I – April 2012 – Revised November 2019

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Figure 7-38. Trip-Zone Submodule

Counter Compare

Digital Compare

Digital Compare

C28 Enhanced Pulse Width Modulator (ePWM) Module

ePWM Submodules

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