Ecc Status Register (Fecc_Status); Test Data Out Low Register (Fecc_Foutl_Test) Field Descriptions; Ecc Status Register (Fecc_Status) Field Descriptions - Texas Instruments Concerto F28M35 Series Technical Reference Manual

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Table 5-139. Test Data Out Low Register (FECC_FOUTL_TEST) Field Descriptions
Bit Field
31-0 DATAOUTL

5.4.4.18 ECC Status Register (FECC_STATUS)

31
15
Reserved
R-0
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 5-140. ECC Status Register (FECC_STATUS) Field Descriptions
Bit Field
31-11 Reserved
10-8 CHK_ERR_POS
7-2 DATA_ERR_POS
1 UNC_ERR
0 SINGLE_ERR
SPRUH22I – April 2012 – Revised November 2019
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Value Description
Low double word test data out. Holds bits 31:0 of the data out of the selected ECC block.
Figure 5-136. ECC Status Register (FECC_STATUS)
11 10
CHK_ERR_POS
R-0
Value Description
Reserved
Test mode ECC bit error position. Holds the bit position in the 8 check bits where the
error occurred.
Test mode data bit error position. Holds the bit position in the 64 bit data where the
error occurred.
Test mode ECC double bit error. When 1 indicates that the ECC test resulted in an
uncorrectable bit error.
Test mode ECC single bit error. When 1 indicates that the ECC test resulted in a single
bit error.
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Reserved
R-0
8 7
DATA_ERR_POS
R-0
Flash Registers
2 1 0
UNC_ERR SINGLE_ERR
R-0 R-0
Internal Memory
16
535