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15.3.2.3
RUNBIST Register
The RUNBIST register is a one-bit register that contains the result of the execution of the
instruction execution. The
inside the processor. After the built-in self-test completes, the processor must be recycled through
the reset state to begin normal operation. See
(pg. 12-6)
for details of the Built-In-Self-Test algorithm.
15.3.2.4
Boundary-Scan Register
The Boundary-Scan register is a required set of serial-shiftable register cells, configured in
master/slave stages and connected between each of the i960 Jx processor's pins and on-chip
system logic. Pins NOT in the Boundary-Scan chain are power, ground and JTAG pins.
The Boundary-Scan register cells are dedicated logic and do not have any system function. Data
may be loaded into the Boundary-Scan register master-cells from the device input pins and output
pin-drivers in parallel by the mandatory
takes place on the rising edge of TCK in the Capture_DR state.
Data may be scanned into the Boundary-Scan register serially via the TDI serial-input pin, clocked
by the rising edge of TCK in the Shift_DR state. When the required data has been loaded into the
master-cell stages, it is driven into the system logic at input pins or onto the output pins on the
falling edge of TCK in the Update_DR state. Data may also be shifted out of the Boundary-Scan
register by means of the TDO serial-output pin at the falling edge of TCK.
instruction runs the built-in self-test (BIST) program resident
runbist
section 12.2.2, "Self Test Function (STEST, FAIL)"
/
sample
preload
TEST FEATURES
and
instructions. Parallel loading
extest
runbist
15
15-7
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