Pulsex - Keithley 4200A-SCS Reference Manual

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Model 4200A-SCS Parameter Analyzer Reference Manual

pulseX

This command directs a SMU to force a voltage or current at a specific level for a predetermined length of time.

int pulsei(int instr_id, double forceval, double time);

int pulsev(int instr_id, double forceval, double time);

The forceval parameter can be positive or negative. For example, sending pulsev(SMU1,

10.0, 10e-3) generates +10 V for 10 ms, and sending pulsei(SMU1, -1.5e-3, 10e-3)

generates -1.5 mA for 10 ms.

The ranges of current and voltage available vary with the instrument type. For more detailed

information, refer to the hardware manuals of the instruments in your system.

After pulseX is executed, the output is turned off. In order to make measurements, the output must

be turned back on. measX can measure:

Residual voltage or current as it decays after removal of the initial application.

Capacitance between DUT pins as the residual voltage or current decays.

All measurements made using the pulseX and measX commands are made after the pulse has

When the source is not operating, measurements are not allowed.

Whenever pulseX is executed, either a default or a programmed current or voltage limit is in effect.

Refer to the limitX (on page 13-75) command for additional information.

When using limitX, rangeX, and pulseX on the same source at the same time in a test sequence,

call limitX, then rangeX, then pulseX.

Note that changing the source mode of the SMU can modify the measure range. If the sourcing mode

is changed from voltage to current sourcing (or from current to voltage sourcing), the measure range

may be changed to minimize variations in the SMU output level. See

recommended command order.

4200A-901-01 Rev. C / February 2017

The instrument identification code

The level of voltage in volts or current in amperes to force; see Details

The pulse duration in seconds; for example, a time of 0.5 initiates a time of 0.5 s,

and a time of 2.0e-2 initiates a time of 20 ms; the minimum practical time for a

source-measure unit (SMU) source is dependent on the voltage or current level

being sourced and the impedance of the device under test (DUT)

Section 13: LPT library function reference

(on page 13-83) for