Matrixulib User Library; Nvm User Library - Keithley 4200A-SCS Reference Manual

Section 6: Clarius

Matrixulib user library

The Matrixulib connects instrument terminals to output pins using a Keithley Instruments Series
700 Switching System. It is for use with switching systems that are configured as a general purpose,
low current, or ultra-low current matrix.
Matrixulib user module
User module
ConnectPins

nvm user library

The nvm user library contains user modules that are used for nonvolatile memory tests that use a
source-measure and a pulse measure unit. The next table lists and briefly describes the user
modules.
For additional detail on working with user modules in the nvm user library, refer to the application note
"Pulse I-V Characterization of Non-Volatile Memory Technologies."
For detail on creating a custom user module for nonvolatile memory tests, refer to the read me file in
the directory C:\s4200\kiuser\usrlib\nvm.
nvm user modules
User module
dcSweep
doubleSweep
doubleSweepSeg
flashEndurance
flashProgramErase
getRes2
pramEndurance
pramSweep
pulse_test
6-314
Description
Allows you to control your switch matrix.
Description
Applies a long signal, either positive or negative. You can specify the rise time,
the slew rate, and the time to hold the voltage at the top or bottom.
Creates a waveform that consists of two voltage sweeps: 0 to V1, V1 to 0, 0 to
V2 and V2 to 0. The sweeps are generated on PMU1CH1. Channel
PMU1CH2 is kept at 0 V and measures current and charge.
Creates a waveform that consists of two voltage sweeps: 0 to V1, V1 to 0, 0 to
V2 and V2 to 0. The sweep is generated on PMU1CH1. Channel PMU1CH2 is
kept at 0 V and measures current and charge.
Defines pulse sequences for the program/erase, program, and erase pulses. It
runs the program/erase sequence a defined number of times by logarithmically
spaced numbers of loops. After each iteration, it does program and erase one
more time with Vt extraction after each operation.
Defines waveform for Programming and Erasing pulse for both drain and gate.
This function returns the resistance of a two-terminal resistor. Voltage
v_force is forced on the top side of the device; 0 V is forced to the low side.
Measure current and reports resistance (V/I).
Runs an endurance test for a PRAM. It runs iterations with a logarithmically
spaced number of SET/PULSE loops. Reports DUT resistance after
SET/RESET pulse. Also returns the amplitude of the SET current.
This function characterizes PRAM devices and produces RI/RV data. A
sequence of SET and RESET pulses, followed by the MEASURE pulses, sets
and resets the PRAM DUT.
Performs pulse testing according to the definition in the nonvolatile memory
structure. This function handles all PMU communications and does all
nonvolatile memory pulse testing.
Model 4200A-SCS Parameter Analyzer Reference Manual
4200A-901-01 Rev. C / February 2017