Negative Bias Temperature Instability Project - Keithley 4200A-SCS Reference Manual

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Table of Contents

Model 4200A-SCS Parameter Analyzer Reference Manual

Appendix L: Wafer-level reliability testing

Negative Bias Temperature Instability project

The Negative Bias Temperature Instability (nbti-1-dut) project performs NBTI testing on a p-

MOSFET with temperature and DC stress. The following figure shows the project tree when the

nbti-1-dut project is selected.

Figure 831: Project tree for nbti-1-dut

4200A-901-01 Rev. C / February 2017