Multiple Smu Stability Considerations - Keithley 4200A-SCS Reference Manual

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Model 4200A-SCS Parameter Analyzer Reference Manual

Section 12: Maintenance

Multiple SMU stability considerations

Using two or more SMUs to test an active device, such as a field-effect transistor (FET) or bipolar

junction transistor (BJT), can aggravate system stability. The next figure shows an example of BJT

characterization curves determined under stable conditions.

Figure 493: Effects of oscillation on test data: Without oscillation

The next figure shows an example of what can happen to a BJT characterization curve when the

system oscillates.

Figure 494: Effects of oscillation on test data: With Oscillation

4200A-901-01 Rev. C / February 2017