Keithley 4200A-SCS Reference Manual page 1377

Index
Loading, aligning, and contacting the wafer • G-16
Load-line effect compensation (LLEC) for the PMU •
5-35, 5-36, 5-37, 5-38, 5-39, 5-40, 5-41
Local Sense / Remote Sense settings • 3-32, A-15
Local sensing • 3-32, 3-33
locking, user module • 8-64
lockout (KULT) • 8-65
locks, removing (KULT) • 8-65
Log sweep operation mode - SMU • 6-37
Low-current measurements • 12-11, 12-14, 12-15
LPT functions • 5-39, 13-1, 13-64, 13-98, 13-177
LPT Library Status and Error codes • 13-222
LR
8028 • 2-18
lsq1 user module • 6-344
M
Main window • 7-2
Making stable measurements • 12-7, 12-8, 12-9, 12-
10
Managing multiple users and multiple 4200-SCS
systems • 11-3
Manual prober overview • I-1
Mark Dies menu • G-22
Master and subordinate step function • 6-155
matrix cards • 4-8, 6-336, A-2, A-5, A-9
matrix card, assign to mainframe slots • A-31
Measure • 3-38, 4-3, 5-4, 6-207, 9-28, 13-21, 13-114
timing • 5-35, 5-80
Methods to compensate for load-line effect • 5-35
Micromanipulator 8860 Prober • G-22, H-2, H-23, H-
27, I-7
minimum compliance • 3-14
Model 82 C-V System add in KCon • D-9
Model 82 projects • D-10
modify • 8-49, 8-50, H-5, I-3
module description, change • 8-51
Module name for Description • 8-51
module parameter display area (KULT) • 8-3
MOS capacitor C-V curves • 4-48
moscap-c-2vsv test • 4-58
moscap-cvsweep test • 4-57
moscap-dopingprofile test • 4-59
moscap-lifetime • 4-67
moscap-mobile-ion • 4-77, 4-79
MOSFET Project (mosfet) • 4-84, 4-85
mosfet-cviv • 4-74
Multiple SMU stability considerations • 12-8
Multiple subsites per die • H-23
Multi-site test sequence • 6-197
My Settings • 6-323
N
Name edit box • 6-50
Index-8
Model 4200A-SCS Parameter Analyzer Reference Manual
nanowire tests • 4-90
NBTI (negative bias temperature instability) • L-3, L-
5, L-10
New library (KULT) • 8-9
New Module dialog box • 8-37
new_lib subcommand • 8-56
Noise and source impedance • 12-14
Number pad area (Formulator) • 6-245
Numerically displaying plot coordinates using
cursors • 6-221
O
Offset currents • 12-12
OkDialog user module example (KULT) • 8-72
Open • 8-46
Open card properties window • A-32
Open connect UTM • A-34
open connection compensation data • 4-12
open KCon • 7-7
Open KULT • 8-44
Open operation mode • 6-23
Open project • 6-16
Open the • 8-46
OpenCal4294 user module • 6-332
Operating boundaries • 3-4, 3-8, 3-10, 3-11, 3-15
operation mode, List Sweep • 6-27, 6-35
operation mode, timing diagrams • 3-40
OptionBtn control (KULT) • 6-132
Options and accessories
cable • 2-17, 3-13, A-7
SMU options • 2-13, 3-15
Switch matrices • 3-32, 6-336, A-2, A-5, A-7, A-
12, A-13, A-15, A-16, A-25, A-29, A-31, A-32,
A-33, A-34
Options menu • 8-12
oscillations, eliminate • 12-9, 12-10
Output data formats • 5-47, 9-51, 9-53, 9-54
Output Values • 6-94
oxide thickness • 4-61
P
PA CNTRL connector • 3-13
PA200 • G-1, G-20
Parameter Name field • 8-4
parameter name, change • 8-50
Parameters tab area (KULT) • 8-4
parameters, entering (KULT) • 8-19
Pattern line-pattern selections • 6-239
pcBridge window (main) • H-2
pcIndie • G-22, H-8, H-23, I-7
pcLaunch window • H-2
pcNav button • H-6
pcWfr button • H-8, H-18
pg2_init • 13-146
4200A-901-01 Rev. C / February 2017