Row-Column Or Instrument Card Settings - Keithley 4200A-SCS Reference Manual

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Model 4200A-SCS Parameter Analyzer Reference Manual

Row-column or instrument card settings

You select the scheme for interconnections between the instruments, the switch-matrix rows and

columns, and the test system (prober or test fixture). You can select:

Row-Column: Connect instruments to rows and prober or test fixture to columns.

Instrument Card: Both instruments and prober or test fixture are connected to columns. Matrix

rows are not used.

The row-column setting is the simplest connection scheme. In this scheme, instruments are

connected to the switch-matrix rows. The prober/test fixture pins or the device under test (DUT) are

connected to the switch-matrix columns (see

signal paths

When you set up a matrix, you also select the sense. You can select:

Local sense: 2-wire conections. Connections are only to instrument FORCE terminals.

Remote sense: 4-wire connections. Connections are to both instrument FORCE and SENSE

For more information regarding local and remote sense, refer to

Row-column scheme

The row-column setting is the simplest connection scheme. In this scheme, instruments are

connected to the switch-matrix rows. The prober/test fixture pins or the device under test (DUT) are

connected to the switch-matrix columns (see

signal paths

Instrument signals can route to prober/test-fixture pins through only one matrix card, as shown in the

following figure. However, the Row-Column scheme limits the number of external instruments. If the

instrumentation requirements exceed eight paths (rows), you must use the instrument card

configuration.

4200A-901-01 Rev. C / February 2017

(on page A-17)).

Figure 529: Row-Column, Local Sense Connection Scheme example

Switch matrix control

(on page A-16) and

Remote sensing

Switch matrix control

(on page A-16) and

Appendix A: Using switch matrices

(on page 3-29).