Keithley 4200A-SCS Reference Manual page 1367

Appendix L: Wafer-level reliability testing
Notes on output variables
test_status:
•
0: No test errors (exit due to measured voltage < factor of the previous value).
•
1: Failed pre-stress test.
•
-2: Cumulative charge limit reached.
•
-3: Maximum time limit reached.
•
-4: Masked Catastrophic Failure.
•
-5: Non-Catastrophic Failure.
•
-6: Invalid specified t_step.
Invalid Test Result - Result = 1e21.
L-18
Model 4200A-SCS Parameter Analyzer Reference Manual
4200A-901-01 Rev. C / February 2017