Keithley 4200A-SCS Reference Manual page 457

Section 6: Clarius
Terminal Settings pane (Analyze)
When Analyze is selected, the Terminal Settings pane displays the settings for the presently selected
test. For information on what settings are available, refer to
page 6-22).
Subsite cycling Analyze sheets
Spreadsheet data for the subsite is acquired in the Analyze sheet for the subsite.
To display subsite data:
1. In the project tree, select the subsite.
2. Select Analyze.
Stress/measure mode Analyze sheet
The following figure shows an example sheet for a subsite that has one device. Analyze spreadsheet
columns include:
•
Column A: The cycles that were run.
•
Column B: The stress times (in seconds) for all cycles. The stress for the first cycle is 0.0
seconds. This is the no-stress cycle for HCI testing.
•
Column C: The measured readings for the first output value, I
•
Column D: Starting with the second cycle, lists the percent change between each post-stress
I reading and the pre-stress I
DOFF
calculated as:
% Change = ABS[(Post-Stress Rdg − Pre-Stress Rdg) / Pre-Stress Rdg x 100]
For the example in the following figure, percent change I
% Change I
•
Column E: The target value that was assigned to the output value in the Subsite Stress
Properties. A target value of 0.0 indicates that the target for I
when the % change value equals or exceeds the target value.
•
Starting with Column F, every three columns provide readings for another output value, the
percent change, and the target value.
6-188
DOFF
ABS[(82.2013e-15 − 291.1666e-15) / 291.1666e-15 x 100]
=
DOFF
=
ABS[−208.9653e-15 / 291.1666e-15 x 100]
=
ABS[−0.7176 x 100]
= 71.8
Model 4200A-SCS Parameter Analyzer Reference Manual
Test and terminal setting descriptions
DOFF
reading in the first cycle. The percent change value is
for the second cycle is calculated as:
DOFF
DOFF
reading for the ID#1 test.
is disabled. A target is reached
4200A-901-01 Rev. C / February 2017
(on