Keithley 4200A-SCS Reference Manual page 1175

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Appendix D: Using a Model 82 C-V System

This method can be used for minority carrier lifetime measurements using Zerbst plot.

The figure below shows the default parameters for the ctsweep UTM, which uses the CtSweep82

user module. In this example, the Model 82 is set to first stress the DUT at +3 V for three seconds,

and then perform 100 capacitance measurements at −3 V using a 0.1 s time interval (see

test description

(on page D-19)). For details on C-t measurements, refer to

Figure 605: CtSweep82 user module

Model 4200A-SCS Parameter Analyzer Reference Manual

4200A-901-01 Rev. C / February 2017

(on page D-18).