Keithley 4200A-SCS Reference Manual page 350

Model 4200A-SCS Parameter Analyzer Reference Manual
SMU Test Settings
The settings that are available for SMU tests are briefly described in the following table. Select the
links to access additional information.
Parameter
Speed (on page 6-82)
Report Timestamps
Delay Factor
Filter Factor
Auto A/D Aperture
A/D Aperture Time
Sweeping Test Mode
Sweep Delay
Sampling Test Mode
Interval (on page 6-86)
Number of Samples
Hold Time
SMU Power On Sequence
6-87)
Disable Outputs at Completion
page 6-87)
Formulator
Output Values
Exit Condition
4200A-901-01 Rev. C / February 2017
(on page 6-82)
(on page 6-84)
(on page 6-85)
(on page 6-85)
(on page 6-85)
(on page 6-86)
(on page 6-86)
(on page 6-86)
(on page 6-86)
(on page 6-87)
(on page
(on
(on page 6-222)
(on page 6-87)
(on page 6-88)
Description
Select a measurement speed that provides the best trade-off between
speed, noise, and accuracy for your test.
When this option is selected, every measurement in the Analyze sheet
includes a timestamp. When this option is cleared, the timestamp is not
included.
Custom Speed only. After applying a voltage or current, the instrument waits
for a delay time before making a measurement. The delay time allows for
source settling. The Delay Factor adjusts the delay time for the selected
speed. It is fixed for Fast, Normal, and Quiet speeds. If you select Custom
Speed, you can type a factor from 0 to 100.
Custom Speed only. To reduce measurement noise, each 4200A-SCS
applies filtering, which may include averaging of multiple readings to make
one measurement. The Filter Factor is fixed for Fast, Normal, and Quiet
speeds. If you select the Custom Speed mode, you can type a Filter Factor
of 0 to 100.
Custom Speed only. When Auto A/D Aperture is selected, the instrument
picks the optimum A/D conversion time for most normal measurements.
Custom Speed only when Auto A/D Aperture is cleared. Specifies the A/D
converter integration time that is used to measure a signal.
Select this mode for tests in which the voltage or current varies with time.
Sweep mode only. If you are using a sweep operation mode and need extra
settling time before each measurement, you can specify an additional delay
with the Sweep Delay. The Sweep Delay is independent of the
(on page 6-84). You can specify a Sweep Delay from 0 s to 999 s. The
default Sweep Delay is 0 s.
Select this mode for tests in which the forced voltage and frequency or
current are static, with measurements made at timed intervals.
Sampling mode only. The time between measurements (data points).
Interval can be set from 0 s to 1000 s.
Sampling mode only. Specifies the number of data points to be acquired.
Set the number of samples to a value from 1 to 4096.
Allows for extra source settling before making the first measurement. The
Hold Time is the same for all SMUs in the test system. Set a hold time
between 0 and 999 s. The default Hold Time is 0 s.
Allows you to adjust the power on sequence of the SMUs.
Allows you to choose whether to disable or enable the SMU outputs when a
test completes.
The Formulator allows you to make data calculations on test data and on
the results of other Formulator calculations.
Select values that are included in the Analyze sheet.
Choose the action that is taken if a source goes into compliance.
Section 6: Clarius
Delay Factor
6-81