R&S ESU Series Operating Manual page 531

R&S ESU
CALCulate:STATistics:NSAMples 100 to 1E9
This command sets the number of measurement points to be acquired for the statistical measurement
functions.
Example:
"CALC:STAT:NSAM 500"
'Sets the number of measurement points to be acquired to 500.
Characteristics: *RST value: 100000
SCPI: device-specific
Mode: A
CALCulate:STATistics:SCALe:AUTO ONCE
This command optimizes the level setting of the instrument depending on the measured peak power,
in order to obtain maximum instrument sensitivity.
To obtain maximum resolution, the level range is set as a function of the measured spacing between
peak power and the minimum power for the APD measurement and of the spacing between peak
power and mean power for the CCDF measurement. In addition, the probability scale for the number
of test points is adapted.
+
Subsequent commands have to be synchronized with *WAI, *OPC or *OPC? to the
end of the auto range process which would otherwise be aborted.
Example:
"CALC:STAT:SCAL:AUTO ONCE;*WAI"
'Adapts the level setting for statistical measurements and activates the
synchronization.
Characteristics: *RST value: --
SCPI: device-specific
Mode: A
This command is an event and therefore has no *RST value and no query.
CALCulate:STATistics:SCALe:X:RLEVel -130dBm to 30dBm
This command defines the reference level for the x-axis of the measurement diagram. The setting is
identical to the reference level setting using the command DISPlay:WINDow:TRACe:Y:RLEVel.
With the reference level offset <> 0 the indicated value range of the reference level is modified by the
offset.
The unit depends on the setting performed with CALC:UNIT.
Example:
"CALC:STAT:SCAL:X:RLEV -60dBm"
Characteristics: *RST value: -20dBm
SCPI: device-specific
Mode: A
6.92
Remote Control – Description of Commands
CALCulate Subsystem
Operating Manual 1302.6163.12 - 03