10Spectrum Emission Mask Measurement - R&S ESU Series Operating Manual

R&S ESU
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EXPORT function.
By selecting the decimal delimiter, various language versions of evaluation pro-
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They are active only as long as a peak list is displayed.
4.8.13.10 Spectrum Emission Mask Measurement
The Spectrum Emission Mask (SEM) measurement defines a measurement that
monitors compliance with a spectral mask. The SEM measurement of the base unit
allows a flexible definition of all parameters in the SEM measurement. The analyzer
performs measurements in predefined frequency ranges with settings that can be
specified individually for each of these ranges.
For this purpose, the SWEEP LIST settings or the current instrument settings are
used. Up to 20 subranges can be defined (they need not directly follow one another)
across which the analyzer sweeps in subsequent order. However, the measurement
ranges must not overlap. The measurement parameters can be selected indepen-
dently from each other in every subrange (SWEEP LIST menu, EDIT SWEEP LIST).
In the Spectrum Emission Mask, as in the Spurious Emissions measurement, a
range defines a segment, for which you can define the following parameters sepa-
rately: start and stop frequency, RBW, VBW, sweep time, reference level, attenuator
settings, and limit values. Via the sweep list, you define the ranges and their settings
(for details on settings refer to the SWEEP LIST softkey).
The following rules apply to ranges:
• The minimum span of a range is 10 Hz.
• The individual ranges must not overlap (but need not directly follow one another).
• The maximum number of ranges is 20.
• A minimum of three ranges is mandatory.
• The reference range cannot be deleted (it is marked in with "Ref").
The frequency range where measurements are actually performed is set by the start
and stop frequency parameters of the analyzer; these parameters are independent
of the sweep ranges. It is thus possible to define sweep ranges for a measurement
task that can be stored and reloaded and to quickly and easily set the frequency
range to be actually measured by means of two parameters; complex editing in the
sweep table is not necessary.
Provided XML Files for the Spectrum Emission Mask Measurement
You can change the settings manually or via XML files. The XML files offer a quick
way to change the configuration. A set of ready-made XML files for different stan-
dards is already provided. For details see Table1: Provided XML files. You can also
create and use your own XML files (for details see
Emission Mask XML files" on page
\r_s\instr\sem_std. Use the LOAD STANDARD softkey for quick access to the avail-
able XML files.
Operating Manual 1302.6163.12 - 03
FORM:DEXP:DSEP POIN
"Format Description of Spectrum
4.228). All XML files are stored under D:
Instrument Functions
Analyzer Mode
4.223