Test Signals - Freescale Semiconductor MCF52277 Reference Manual

PST[3:0]
(MCF52274)
1110
1111
2.3.20

Test Signals

Table 2-23 describes test signals reserved for factory testing.
Signal Name
Test
2.3.21 Power and Ground Pins
The pins described in Table 2-24
provided for adequate current capability. All power supply pins must have adequate bypass capacitance
for high-frequency noise suppression.
Signal Name
PLL Analog Supply
Oscillator
Positive I/O Supply
Positive Core Supply
SDRAMC Supply
USB Supply
Real-time clock Supply VDD_RTC
ADC supply
Ground
Freescale Semiconductor
Table 2-22. Processor Status (continued)
ALLPST
(MCF52277)
0 Processor is stopped
1 Processor is halted
Table 2-23. Test Signals
Abbreviation
TEST Reserved for factory testing only and in normal modes of operation
should be connected to VSS to prevent unintentional activation of test
functions.
provide system power and ground to the device. Multiple pins are
Table 2-24. Power and Ground Pins
Abbreviation
VDD_A_PLL Dedicated power supply signal to isolate the sensitive PLL analog
(VCO) circuitry from the normal levels of noise present on the digital
power supply.
VDD_OSC Dedicated power supply signals to isolate the sensitive oscillator
VSS_OSC circuitry from the normal levels of noise present on the digital power
supply.
EVDD These pins supply positive power to the I/O pads
IVDD These pins supply positive power to the core logic.
SD_VDD These pins supply positive power to the SDRAM controller.
VDD_USB These pins supply positive power to the USB controller.
These pins supply positive power to the RTC module.
VDD_ADC Dedicated power supply for the touchscreen controller/ADC.
VSS_ADC
VSS These pins are the negative supply (ground) for the device.
MCF52277 Reference Manual, Rev. 1
Processor Status
Function
Function
.
Signal Descriptions
I/O
I
I/O
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2-15