Intel 8XC196K Series User Manual page 624

Table of Contents

DC input leakage

differential nonlinearity

The voltage change corresponding to the difference

between two adjacent code transitions. Code width

deviations cause differential nonlinearity and nonlin-

earity errors.

See off-isolation.

Leakage current from an analog input pin to ground.

The act of making a signal inactive (disabled). The

polarity (high or low) is defined by the signal name.

Active-low signals are designated by a pound symbol

(#) suffix; active-high signals have no suffix. To

deassert RD# is to drive it high; to deassert ALE is to

drive it low.

The difference between the actual code width and the

ideal one-LSB code width of the terminal-based

characteristic of an A/D converter. It provides a

measure of how much the input voltage may have

changed in order to produce a one-count change in the

conversion result. Differential nonlinearity is a

measure of local code-width error; nonlinearity is a

measure of overall code-transition error.

The process of introducing a periodic table Group III

or Group V element into a Group IV element (e.g.,

silicon). A Group III impurity (e.g., indium or

gallium) results in a p-type material. A Group V

impurity (e.g., arsenic or antimony) results in an n-

type material.

Any 32-bit unit of data.

An unsigned, 32-bit variable with values from 0

Dual-port RAM. A type of random-access memory

commonly used to hold shared data when using a

parallel bus for communication between two CPUs.

Event processor array. An integrated peripheral that

provides high-speed input/output capability.

Erasable, programmable read-only-memory.

Electrostatic discharge.