Status Subsystem - Agilent Technologies 4155C Command Reference Manual

Semiconductor parameter analyzer precision semiconductor parameter analyzer
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STATus Subsystem

The STATus subsystem accesses the non-IEEE488.2 status structures of the
4155C/4156C.
These status structures are as follows:
Operation Status Register (for SCPI) Consists of CONDITION, TRANSITION
FILTER, EVENT, and event enable (MASK) registers.
Questionable Status Register (for SCPI) Consists of CONDITION,
TRANSITION FILTER, EVENT, and event enable (MASK) registers.
Emergency Status Register (for 4155C/4156C) Consists of EVENT and event
enable (MASK) registers.
Measure/Stress Status Register (for 4155C/4156C) Consists of EVENT and
event enable (MASK) registers.
Refer to Chapter 3 for details about these registers and about the status-reporting
structure of both non-IEEE488.2 and IEEE488.2 status structures.
The following table is the command tree of STATus subsystem.
Command
:STATus
:EMERgency
:ENABle
[:EVENt]?
:MEASurement
:ENABle
[:EVENt]?
:OPERation
:CONDition?
:ENABle
[:EVENt]?
Agilent 4155C/4156C SCPI Command Reference, Edition 1
SCPI Commands
Parameter
<numeric_value>
<numeric_value>
<numeric_value>
5-289

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