Page:measure:sampling:period - Agilent Technologies 4155C Command Reference Manual

Semiconductor parameter analyzer precision semiconductor parameter analyzer
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Parameter
Query response
Example
Syntax
Parameter
Query response
Example
Parameter
Type
LINear
character
L10
character
L25
character
L50
character
THINnedout
character
LIN | L10 | L25 | L50 | THIN <newline><^END>
OUTPUT @Hp4155;":PAGE:MEAS:SAMP:MODE LIN"
OUTPUT @Hp4155;":PAGE:MEAS:SAMP:MODE?"
ENTER @Hp4155;A$

:PAGE:MEASure:SAMPling:PERiod

This command sets the TOTAL SAMPLING TIME for sampling measurement.
This command is available for LINear and THINnedout mode.
:PAGE:MEASure:SAMPling:PERiod total_samp_time | INFinity | MINimum |
MAXimum
Parameter
total_samp_time
numeric
INFinity
character
total_samp_time <newline><^END>
total_samp_time is NR3 response data type.
OUTPUT @Hp4155;":PAGE:MEAS:SAMP:PER 10"
OUTPUT @Hp4155;":PAGE:MEAS:SAMP:PER?"
ENTER @Hp4155;A
Agilent 4155C/4156C SCPI Command Reference, Edition 1
:PAGE:MEASure:SAMPling:PERiod
linear sampling mode
logarithmic sampling (10 points per decade)
logarithmic sampling (25 points per decade)
logarithmic sampling (50 points per decade)
thinned-out sampling mode
Type
60E-6 to 1E11 (s).
minimum: initial_interval ´ (no_of_samples-1)
no limit (disables total sampling time and
number of samples stop events.)
SCPI Commands
Explanation
Explanation
5-213

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