Agilent Technologies 4155C Command Reference Manual page 162

Semiconductor parameter analyzer precision semiconductor parameter analyzer
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SCPI Commands
Command Hierarchy
:PAGE
:GLISt
[:GRAPhics]
:LIST
:KSWeep
:MEASure
[:SWEep]
:SAMPling
:QSCV
:PGUSetup
:MSETup
:OSEQuence
:SCONtrol
:STRess
[:CDEFinition]
:SETup
:FORCe
:SYSTem
:FILer
:MISC
:CONFig
:CDIagnostic
:PRINt
:COLor
5-80
Agilent 4155C/4156C SCPI Command Reference, Edition 1
User Interface Page Name
GRAPH/LIST: GRAPHICS
GRAPH/LIST: LIST
KNOB SWEEP
MEASURE: SWEEP SETUP
MEASURE: SAMPLING SETUP
MEASURE: QSCV SETUP
MEASURE: QSCV MEASURE SETUP
MEASURE: PGU SETUP
MEASURE: MEASURE SETUP
MEASURE: OUTPUT SEQUENCE
( state control)
STRESS: CHANNEL DEFINITION
STRESS: STRESS SETUP
STRESS: STRESS FORCE
for changing pages only, not setting.
SYSTEM: FILER
SYSTEM: MISCELLANEOUS
SYSTEM: CONFIGURATION
SYSTEM: SELF-CALIBRATION/DIAGNOSTICS
SYSTEM: PRINT/PLOT SETUP
SYSTEM: COLOR SETUP

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