Graphs - Agilent Technologies E5071C Manual

E5071C
Lower limit (defined by the total system uncertainty
•
specification)
Measurement result
•
Upper limit (defined by the total system uncertainty
•
specification)
Test status (PASS or FAIL). Asterisks (**) is displayed at fail
•
points.

Graphs

1. Upper limit line (defined by the total system uncertainty
specification)
2. Lower limit line (defined by the total system uncertainty
specification)
3. Measured value at factory (Memory trace)
4. Measured value (Data trace)
5. Parameter name (S11, S12 etc.), format (Lin, Log or Phase)
6. Device name and serial number
870