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STDERA,B,C,D,E—Self-Test Data Error Registers
Address
BB + 0001 0000 to 0001 C100
Access
R/W
The four sets of STDERx_n registers are used to isolate self-test
failures down to a single failing bit or bits. When self-test is exe-
cuted any data bit error(s) that are detected by the self-test data
compare logic will set the appropriate data bit(s) in these regis-
ters. The operation and contents of this register can be affected by
bits <2:0> of the DDR0:3 registers in the MDI ASICs.
31
31
31
31
31
RSVD
The function of STDERA is slightly different from the other four registers
(STDERB,C,D,E). STDERA can be written or read, while the other four
are read only. STDERA can be used by diagnostics to ensure that most of
the data path and control logic, to and from the various CSRs, is fully func-
tional.
Table 7-50 describes each field of self-test error data registers A,B,C,D.
These four registers are used to store failing self-test data bits <127:0> in
MDI0, <255:128> in MDI1, <383:256> in MDI2, and <511:384> in MDI3.
ADAT
ADAT
BDAT
BDAT
19
18
16
15
STDERE
VRC
0
STDERA
0
STDERB
0
STDERC
0
STDERD
0
STDERE
BXB-0754-93
System Registers 7-103
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