Nortel DMS-100 Series Maintenance Manual page 129

• BIC_LA_TEST
• RTTS_CM_TEST
• BIC_LOOPAROUND
• SANITY_TIMEOUT_FAIL
• BIC_SCAN_TEST
• SET_MSG_LOOPAROUND
• DCC_LA_TEST
• SUBCYCLE_LENGTH_FAIL
• DS1_LOOPAROUND
• SUBCYCLE_ORDER_FAIL
• IUC_LA_TEST
• TIMING_TEST
• LC_COM_TEST
• WRITE_PROTECT_FAIL
• LCC_FAIL
• ZERO_CROSSING_INT_FAST_FAIL
• LCC_LOOPAROUND
• ZERO_CROSSING_INT_SLOW_FAIL
• MEMORY_TEST
Faults that occur on a BIC drawer affect call processing. The unit that is in
service and controls the drawer does not affect this condition. Because the full
in-service tests use the DCC, determine that the fault is not in the DCC.
Takeover is justified in the DCC. A reported drawer fault can cause a takeover.
When this event occurs, the DCC is at fault event though the LCM fails the BIC
test.
In the takeover mode, the inactive unit DCC cannot access any drawers for call
processing. The inactive unit DCC can access any drawer for tests. The active
LCM unit has access to all drawers through the DCC.
Valid drawer faults do not take an LCM unit out-of-service. The status of the
unit continues to be ISTb. The ISTb reason is Self Test or Diag Fail. The test
that failed and causes the ISTb condition determines the reason. Additional
diagnostic information is available for LCM shelves with the NT6X51AB
expanded memory board. After the CC detects an LCM unit is ISTb, the unit
can still be made SysB. The reception of many unsolicited messages can cause
the LCM to become SysB.
DMS-100 Family OPM Maintenance Manual ISN07 (TDM)/SN07 (DMS) and up
Functional overview 2-53