JEOL JSPM-5200 Instructions Manual page 96

modify the
vacuum SPM instruments.
• Judgment of approach conditions
Whether approach has finished or not is judged by measuring the voltage applied to
the Z scanner. The voltage is set to ± 0 V at the time of shipment from the factory.
Specify approach conditions in the Advanced tab window. You cannot specify
approach conditions in the AC Mode tab window.
• Halt of approach
When approach starts. the Approach window appears. If you click on Stop,
approach stops.
■ Observ
ation
To observe an image, click on Scan in the SPM Scan pull-down menu.
Scanning will start and an image will be displayed in the display window.
■ Captur
ing an image
•
When Auto Grab (in the AC Mode tab window) is checked
Each time measurement ends, an image is captured automatically.
• When Auto Grab (AC Mode tab window) is deselected
To capture an image, click on Grab during image scan. The image is recorded in
memory immediately after a frame is scanned, then automatically stored in the
specified folder as a temporary file. Unless the Grab button is clicked, the
measurement repeats and the image is not captured.
• The offset to the input signal for image display is calculated automatically.
Offset is controlled in the Advanced window.
■ Considerations in image observation
• In the AC mode, an important factor for obtaining a quality image is the distance
between the specimen and the cantilever tip. If this setting is inappropriate, not only
can a quality image not be obtained, but also damage to specimen and the cantilever
may result.
• You can set the distance between the specimen and the cantilever tip using the
Reference function. If the RMS value is –5.6 V, provided that it is set to –1.6 V
initially when the cantilever is away from the specimen, this may indicate that the
cantilever tip is too far from the specimen. An RMS value of 0 V, means that the
cantilever tip has collided with the specimen surface.
• Normally, while observing an image from a separated position, gradually move the
cantilever tip toward the 0 V side (the direction toward the specimen), and set it in the
optimum position so that the best image can be photographed.
• You can visually confirm the distance between the specimen and the cantilever at Z
Piezo Position. It appears in gray during scanning. Adjust it before starting to scan.
TMPM5200-2
speed of approach in any SPM instrument other than ultra-high
５ MEASUREMENT OPERATION
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