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５ MEASUREMENT OPERATION
STM
The following measurements are possible:
Shape measurement
SPS (Scanning probe spectroscopy) measurement
SPS mapping measurement
All SPM Mode
In this mode, the above three modes (AC AFM, Contact AFM, and STM) can run
simultaneously. Since neither restriction nor protection on the control of SPM
measurement is provided, it is mandatory that you thoroughly understand the
system and nature of the measurement.
5-8
The optional lock-in amplifier is needed for measurement of viscoelasticity,
lateral modulation friction force microscopy and electrostatic force microscopy.
No optional measurement is available in the standard system configuration.
TMPM5200-2
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