Introduction - JEOL JSPM-5200 Instructions Manual

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INTRODUCTION

The JSPM − 5200 Scanning Probe Microscope is designed not only to meet researchers'
increasing demands for applied observation modes but also to make the most of the
intrinsic functions of a scanning probe microscope. This instrument is easy to use and is
superb in its expandability, enabling a number of people from novices to professional
SPM researchers to use it.
The following are the main features of this instrument.
• It is possible to observe specimens under various conditions, from in a liquid to under
high vacuum, not to mention under atmospheric pressure, by attaching optional
accessories without making any modification of the basic unit.
• Moreover, it is possible to observe a specimen that is being heated or cooled by
attaching a simple optional accessory.
• You can handle quite a variety of modes such as AFM (Contact and AC modes), phase
image, FFM, STM, CITS and I-V using the standard instrument configuration. In
addition, you can use the observation modes for Kelvin-probe microscope images,
viscoelasticity images and pulsed force images by installing appropriate optional
accessories on the instrument.
• The control software operates under Windows, and the control panel is of the tab type,
with only the minimum necessary controls, thus being easy to use even to SPM
novices.
• A personal login function with which you can create your own environment, greatly
simplifies the operation of the instrument.
TMPM5200-2
1 GENERAL
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