5 MEASUREMENT OPERATION
■
Observ
ation of an image
1.
To s
The following images will be obtained.
2.
Increase the input sensitivity of the lock-in amplifier (from 1 mV to 100 nV
direction) using the Sensitivity setting key (▼) in the range in which the
signals from the lock-in amplifier do not saturate.
3.
Specify the SPM parameters for usual operation so that you can obtain an
optimum topography image.
4.
Change the follow
elasticity image as well as an optimum viscosity image.
• Oscillatio
• Oscillation level (OSC Level/V)
5-94
tart scans,
click on t
he Sca
Sometimes an oscillating sound is made depending upon the characteristic
frequency of the scanner that you use. If it happens, reduce the oscillation level
(OSC Level/V), or shift the present oscillation frequency (OSC Fre-
quency/kHz) setting position until the sound is not made.
When using Model 5110 and the signal becomes saturated, the OLVD LED
li
ghts up.
The area in which both A
become bright is the one in which elasticity and viscos
ing
parameters so that you can obtain an optimum
n frequen
cy (
OSC Frequency/kHz)
If the difference of specimens in elasticity and viscosity is small, for example,
same kinds of materials such as composite plastic are mixed, inc
tion frequency, and then you will obtain better images.
When using hard cantilevers such as a Si cantilever, reduce oscillation level to
observe the image. If oscillation level is too large, the cantilever may break. To
the contrary, when using soft cantilevers, increase oscillation level. Generally
speaking, when you measure viscoelasticity, to obtain a good image, use a hard
cantilever.
n butto
n in the Contact
Acos φ
Topography
(Elasticity
(Topography
image)
image)
Asin φ
(Viscosity
image)
cosφ (
elastici
ty) and Asin
Mod
e tab w
indow.
φ (viscosity) images
ity are large.
rease oscilla-
TMPM5200-2
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