Ve-Afm Tab - JEOL JSPM-5200 Instructions Manual

Scanning probe microscope
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5
.4.3
V
E-AFM Tab
Visco
elastic
supplied to order. Conne
softw
are in accordan
Usua
lly you obs
sample, however, you may not be able to obtain a good image. You can obtain only
perturbed images due to
problem, use AC mode. Then you can obtain good results. Viscoel sticity observation in
AC
mode will be performed through use of the
frequency (about 300 kHz) of the cantilever a d the modulation fr quency (several tens
of kHz) for viscoelasticity observation.
■ Mounti
ng a sample
In or
der to observe a viscoelasticity image correctly, it is essential to af
fi
rmly to the specimen stub using conductive paste instead of double-faced tape.
■ Confirmation before an approach
Affix the specimen, adjust the laser and photodiode, and then perform the coarse
approach according to the procedure in Section 5.4.1, "Approach."
TMPM5200-2
ity image obs
ervation is
ct the lock-in am
ce wi
th the procedu
erve a v
isco
elasticity image using Contact mode. Depending on the
the adhesion of the
5 MEASUREMENT OPERATION
an option
al function tha
plifier to the SPM controller and set the
re in Section 5.2.5, "Lock-in amplifier."
cantilever to the sample. To avoid this
difference between the resonance
n
Specimen
Conductive paste
Specimen stub
t requ
ires a lock-in am
plifier
a
e
fix the sample
5-41

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